ALD FILMS
*deposited ALD HfO2 followed by Nitridation process
| ALD FILM TYPE | WAFER SIZE | THICKNESS RANGE AVAILABLE | THICKNESS TOLERANCE | TEMPERATURE (ºC) |
|---|---|---|---|---|
| Al2O3 | 200mm, 300mm | 5 – 1000 Å | + / – 5% | 330/470 |
| HfO2 | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
| HfON* | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
| HfSiO2 | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
| HfSiON* | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
| SiN | 200mm, 300mm | 10 – 350 Å | + / – 5% | 450 |
| SiO2 | 200mm, 300mm | 10 – 350 Å | + / – 5% | 470 |
| Ta2O5 | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
| TaCN | 200mm, 300mm | 100 – 150 Å | + / – 5% | 330 |
| TiN | 200mm, 300mm | 20 – 200 Å | + / – 5% | 500 |
| ZrO2 | 200mm, 300mm | 5 – 200 Å | + / – 5% | 330 |
CVD FILMS
| CVD FILM TYPE | WAFER SIZE | THICKNESS RANGE AVAILABLE | THICKNESS TOLERANCE | REFRACTIVE INDEX | TEMPERATURE (ºC) | STRESS |
|---|---|---|---|---|---|---|
| Amorphous Silicon | 200mm | 500 – 20,000 Å | +/- 5% | NA | 200, 350 | PECVD |
| SiC | 200mm, 300mm | 50 – 10,000 Å | +/- 5% | 1.5 – 2.0 | 400 | PECVD |
| SiCN | 200mm, 300mm | 500 – 10,000 Å | +/- 5% | NA | 370, 400 | PECVD |
| SiCO | 200mm, 300mm | 300 – 5,000 Å | +/- 5% | NA | 400 | PECVD |
| Silox | 200mm, 300mm | 500 – 20,000 Å | +/- 5% | 1.46 +/- 0.05 | 400 | PECVD |
| SiN | 200mm, 300mm | 120 – 20,000 Å | +/- 5% | 2.01 +/- 0.14 | 400 | PECVD |
| SiON | 200mm, 300mm | 500 – 10,000 Å | +/- 5% | 1.8 +/- 0.1 | 400 | PECVD |
| TEOS | 200mm, 300mm | 500 – 10,000 Å | +/- 5% | 1.46 +/- 0.05 | 400 | PECVD |
| W | 200mm | 1,000 – 6,000 Å | +/- 5% | NA | 415 | CVD |
LPCVD FILMS
| LPCVD FILMS TYPE | WAFER SIZE | THICKNESS RANGE AVAILABLE | THICKNESS TOLERANCE | REFRACTIVE INDEX | TEMPERATURE (ºC) | STRESS |
|---|---|---|---|---|---|---|
| Amorphous Silicon | 200mm, 300mm | 250Å – 1.1μ | +/- 5% | 4.41 | 530 | variable based on dep conditions |
| Oxide | 200mm | 100Å – 2μ | +/- 5% | 1.458 | 715 | textless 250 MPa Compressive |
| Polysilicon | 200mm, 300mm | 300Å – 2μ | +/- 5% | 3.87 | 620 | |
| Silicon Nitride | 200mm | 200Å – 0.75μ | +/- 5% | 2.00 +/- 0.02 | 775 | ﹥ 1K MPa Tensile |
THERMAL OXIDES
| THERMAL OXIDES TYPE | WAFER SIZE | THICKNESS RANGE AVAILABLE | THICKNESS TOLERANCE | REFRACTIVE INDEX | TEMPERATURE (ºC) |
|---|---|---|---|---|---|
| Dry ﹤ 500 Å | 200mm, 300mm | 20 – 500 Å | +/- 10% | 1.458 | 800 – 1,100 |
| Dry ﹥ 500 Å | 200mm, 300mm | 500 – 3,000 Å | +/- 5% | 1.458 | 800 – 1,100 |
| Dry Chlorinated ﹤ 500 Å | 200mm, 300mm | 20 – 500 Å | +/- 10% | 1.458 | 800 – 1,100 |
| Dry Chlorinated ﹥ 500 Å | 200mm, 300mm | 500 – 3,000 Å | +/- 5% | 1.458 | 800 – 1,100 |
| Wet | 200mm, 300mm | 1,000 – 3μ | +/- 5% | 1.458 | 800 – 1,100 |
PVD FILMS
*All depositions listed at 22ºC are uncontrolled set points and will have some variability.
| PVD FILM TYPE | WAFER SIZE | THICKNESS RANGE AVAILABLE | THICKNESS TOLERANCE | TEMPERATURE (ºC) |
|---|---|---|---|---|
| Al | 200mm, 300mm | 20 – 1,000 Å | +/- 10% | 22* |
| AL 0.5% Cu | 200mm | 500 – 10,000 Å | +/- 10% | 300 |
| Co | 200mm | 200 – 2,000 Å | +/- 10% | 300 |
| Co | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Cu | 200mm, 300mm | 50 – 2000 Å | +/- 10% | 40, -50 |
| Hf | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Mo | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Ni | 200mm | 100 – 600 Å | +/- 10% | 50 |
| Ni | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Pt | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Ru | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Si | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| SiN | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Ta | 200mm | 50 – 1,000 Å | +/- 10% | -50 |
| Ta | 200mm | 50 – 500 Å | +/- 10% | -20 |
| Ta | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| TaN | 200mm | 50 – 500 Å | +/- 10% | -50 |
| TaN | 200mm | 50 – 500 Å | +/- 10% | -20 |
| TaN | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Ti | 200mm | 300 – 2,000 Å | +/- 10% | 300 |
| Ti | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Ti Collimated | 200mm | 250 – 1,000 Å | +/- 10% | 250 |
| TiN | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| TiN Collimated | 200mm | 250 – 1,000 Å | +/- 10% | 250 |
| TiO2 | 200mm, 300mm | 20 – 50 Å | +/- 10% | 22* |
| W | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
| Zr | 200mm, 300mm | 50 – 500 Å | +/- 10% | 22* |
SPIN COATINGS
| SPIN COAT TYPE | WAFER SIZE | TYPE | THICKNESS RANGE AVAILABLE | WIW RANGE |
|---|---|---|---|---|
| AZ nLOF Photoresist | 200mm | broadband | 7.0 – 9.0μ | ﹤ 0.35μ |
| 193nm Bottom Anti-Reflective Coating | 200mm, 300mm | ArF | 600 – 800 Å | ﹤ 20 Å |
| Dow SPR220 Photoresist | 200mm | broadband | 2.3 – 10.0μ | ﹤ 0.35μ |
| TOK TArF-P6239 | 200mm, 300mm | ArF | 1,100 – 1,900 Å | ﹤ 30 Å |
| TOK TarF-P7067 Photoresist | 200mm, 300mm | ArF | 2,700 – 5,400 Å | ﹤ 30 Å |
| TOK TarF-P7067 Photoresist | 200mm, 300mm | ArF | 2,700 – 4,000 Å | ﹤ 50 Å |
| Microchem PMGI Liftoff Underlayer | 200mm | NA | request | request |
| HD MicroSystems PI-2610 Polyimide | 200mm | NA | request | request |
| HD MicroSystems HD8820 Photodefinable Polyimide | 200mm | broadband | request | request |
| Sumika PFI-38A5 Photoresist | 200mm, 300mm | Broadband, I-line | 1.0 | ﹤ 100 Å |